Dr. Martin Allinger
With ICs in the field of analog, mixed-signal and RF becoming more and more complex, verification and testing become more and more crucial to the success of a project.
Good verification and testing can prevent unsatisfied customers and expensive customer returns, as well as reduce cost for the final product. In this sense, efficient testing with good coverage is one of the most important challenges for today’s IC development teams.
This seminar will give an overview of today’s opportunities and best practices in testing and verification.
- Introduction: Development flow of an IC
- Test setups and equipment (including ATE)
- Basic measurement and test concepts (DC)
- DAC testing
- Data analysis and statistics
- Sampling theory and DSP-based testing
- ADC testing
- Design for test
- Typical analog test Issues/ pitfalls
- Junior test and verification engineers
- Electrical system and design engineers, who want to get an overview over the task and challenges in test and verification of ICs
Dr. Martin Allinger studied Electrical Engineering at the Friedrich-Alexander University of Erlangen-Nuremberg, Germany with focus on microelectronics. He started his career in 2007 as a development engineer at Texas Instruments with focus on the development of production test solutions for high performance data converters.
In 2012, he received his doctoral degree from the Friedrich-Alexander University of Erlangen-Nuremberg and joined the IC development team of eesy-ic Ltd in Nuremberg.
For more information please contact us.